Wavelet analysis of speckle patterns with a temporal carrier

A novel temporal phase-analysis technique that is based on wavelet analysis and a temporal carrier is presented. To measure displacement on a vibrating object by using electronic speckle pattern interferometry, one captures a series of sp...

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書目詳細資料
Main Authors: Fu, Yu, Tay, Cho Jui, Quan, Chenggen, Miao, Hong
其他作者: Temasek Laboratories
格式: Article
語言:English
出版: 2010
主題:
在線閱讀:https://hdl.handle.net/10356/92121
http://hdl.handle.net/10220/6468
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機構: Nanyang Technological University
語言: English