Phase extraction from electronic speckle patterns by statistical analysis

• المؤلفون الرئيسيون: Tay, Cho Jui, Quan, Chenggen, Chen, Lujie, Fu, Yu
• مؤلفون آخرون: Temasek Laboratories
• التنسيق: مقال
• اللغة: English
• منشور في: 2011
• الموضوعات: DRNTU::Science::Physics::Optics and light
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/91582; http://hdl.handle.net/10220/6705

In electronic speckle pattern interferometry (ESPI), speckles are information carriers as well as noise that hinders the extraction of high quality phase. This paper presents a phase extraction method based on the statistical property of speckles. Assuming that speckle related phase is a random vari...