Growth, crystal structure, and properties of epitaxial BiScO3 thin films
Epitaxial thin films of BiScO3—a compound thermodynamically unstable under ambient conditions—were grown on BiFeO3-buffered SrTiO3 substrates. X-ray diffraction confirmed the reasonable crystalline quality of the films with a full width at half maximum of 0.58° in ω (004 reflection), 0.80° in ϕ (222...
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Main Authors: | , , , , , |
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Other Authors: | |
Format: | Article |
Language: | English |
Published: |
2011
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/93868 http://hdl.handle.net/10220/6932 |
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Institution: | Nanyang Technological University |
Language: | English |
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