Growth, crystal structure, and properties of epitaxial BiScO3 thin films

Epitaxial thin films of BiScO3—a compound thermodynamically unstable under ambient conditions—were grown on BiFeO3-buffered SrTiO3 substrates. X-ray diffraction confirmed the reasonable crystalline quality of the films with a full width at half maximum of 0.58° in ω (004 reflection), 0.80° in ϕ (222...

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Main Authors: Takayama-Muromachi, Eiji, Trolier-McKinstry, Susan, Biegalski, Michael D., Wang, Junling, Belik, Alexei A., Levin, Igor
其他作者: School of Materials Science & Engineering
格式: Article
語言:English
出版: 2011
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在線閱讀:https://hdl.handle.net/10356/93868
http://hdl.handle.net/10220/6932
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機構: Nanyang Technological University
語言: English