On the origin of the redshift in the emission wavelength of InGaN/GaN blue light emitting diodes grown with a higher temperature interlayer

A redshift of the peak emission wavelength was observed in the blue light emitting diodes of InGaN/GaN grown with a higher temperature interlayer that was sandwiched between the low-temperature buffer layer and high-temperature unintentionally doped GaN layer. The effect of interlayer growth tempera...

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Main Authors: Kyaw, Z., Ji, Y., Dikme, Y., Ju, Zhengang, Tan, Swee Tiam, Zhang, Zi-Hui, Sun, Xiaowei, Demir, Hilmi Volkan
其他作者: School of Electrical and Electronic Engineering
格式: Article
語言:English
出版: 2012
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在線閱讀:https://hdl.handle.net/10356/94655
http://hdl.handle.net/10220/8126
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機構: Nanyang Technological University
語言: English
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spelling sg-ntu-dr.10356-946552020-03-07T13:57:27Z On the origin of the redshift in the emission wavelength of InGaN/GaN blue light emitting diodes grown with a higher temperature interlayer Kyaw, Z. Ji, Y. Dikme, Y. Ju, Zhengang Tan, Swee Tiam Zhang, Zi-Hui Sun, Xiaowei Demir, Hilmi Volkan School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering A redshift of the peak emission wavelength was observed in the blue light emitting diodes of InGaN/GaN grown with a higher temperature interlayer that was sandwiched between the low-temperature buffer layer and high-temperature unintentionally doped GaN layer. The effect of interlayer growth temperature on the emission wavelength was probed and studied by optical, structural, and electrical properties. Numerical studies on the effect of indium composition and quantum confinement Stark effect were also carried out to verify the experimental data. The results suggest that the redshift of the peak emission wavelength is originated from the enhanced indium incorporation, which results from the reduced strain during the growth of quantum wells. Published version 2012-05-23T02:33:58Z 2019-12-06T18:59:43Z 2012-05-23T02:33:58Z 2019-12-06T18:59:43Z 2012 2012 Journal Article Ju, Z., Tan, S. T., Zhang, Z.-H., Ji, Y., Kyaw, Z., Dikme, Y., et al. (2012). On the origin of the redshift in the emission wavelength of InGaN/GaN blue light emitting diodes grown with a higher temperature interlayer. Applied physics letters, 100. https://hdl.handle.net/10356/94655 http://hdl.handle.net/10220/8126 10.1063/1.3694054 165110 en Applied physics letters © 2012 American Institute of Physics. This paper was published in Applied Physics Letters and is made available as an electronic reprint (preprint) with permission of AIP. The paper can be found at the following official DOI: [http://dx.doi.org/10.1063/1.3694054].  One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law. 5 p. application/pdf
institution Nanyang Technological University
building NTU Library
country Singapore
collection DR-NTU
language English
topic DRNTU::Engineering::Electrical and electronic engineering
spellingShingle DRNTU::Engineering::Electrical and electronic engineering
Kyaw, Z.
Ji, Y.
Dikme, Y.
Ju, Zhengang
Tan, Swee Tiam
Zhang, Zi-Hui
Sun, Xiaowei
Demir, Hilmi Volkan
On the origin of the redshift in the emission wavelength of InGaN/GaN blue light emitting diodes grown with a higher temperature interlayer
description A redshift of the peak emission wavelength was observed in the blue light emitting diodes of InGaN/GaN grown with a higher temperature interlayer that was sandwiched between the low-temperature buffer layer and high-temperature unintentionally doped GaN layer. The effect of interlayer growth temperature on the emission wavelength was probed and studied by optical, structural, and electrical properties. Numerical studies on the effect of indium composition and quantum confinement Stark effect were also carried out to verify the experimental data. The results suggest that the redshift of the peak emission wavelength is originated from the enhanced indium incorporation, which results from the reduced strain during the growth of quantum wells.
author2 School of Electrical and Electronic Engineering
author_facet School of Electrical and Electronic Engineering
Kyaw, Z.
Ji, Y.
Dikme, Y.
Ju, Zhengang
Tan, Swee Tiam
Zhang, Zi-Hui
Sun, Xiaowei
Demir, Hilmi Volkan
format Article
author Kyaw, Z.
Ji, Y.
Dikme, Y.
Ju, Zhengang
Tan, Swee Tiam
Zhang, Zi-Hui
Sun, Xiaowei
Demir, Hilmi Volkan
author_sort Kyaw, Z.
title On the origin of the redshift in the emission wavelength of InGaN/GaN blue light emitting diodes grown with a higher temperature interlayer
title_short On the origin of the redshift in the emission wavelength of InGaN/GaN blue light emitting diodes grown with a higher temperature interlayer
title_full On the origin of the redshift in the emission wavelength of InGaN/GaN blue light emitting diodes grown with a higher temperature interlayer
title_fullStr On the origin of the redshift in the emission wavelength of InGaN/GaN blue light emitting diodes grown with a higher temperature interlayer
title_full_unstemmed On the origin of the redshift in the emission wavelength of InGaN/GaN blue light emitting diodes grown with a higher temperature interlayer
title_sort on the origin of the redshift in the emission wavelength of ingan/gan blue light emitting diodes grown with a higher temperature interlayer
publishDate 2012
url https://hdl.handle.net/10356/94655
http://hdl.handle.net/10220/8126
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