Temperature control with a thermoelectric cooler (TEC) during laser decapsulation of plastic packages
Ablation was carried out on high voltage Schottky rectifiers at 25°C and -5°C (with a thermoelectric cooler or TEC), at 1.0 W and 3.9 W of laser power. In-situ measurement of the reverse current was conducted and correlated to the device junction temperature. It was found that the usage of a TEC inc...
Saved in:
Main Authors: | , , |
---|---|
Other Authors: | |
Format: | Conference or Workshop Item |
Language: | English |
Published: |
2012
|
Subjects: | |
Online Access: | https://hdl.handle.net/10356/94719 http://hdl.handle.net/10220/8186 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | Nanyang Technological University |
Language: | English |
id |
sg-ntu-dr.10356-94719 |
---|---|
record_format |
dspace |
spelling |
sg-ntu-dr.10356-947192023-07-08T05:41:04Z Temperature control with a thermoelectric cooler (TEC) during laser decapsulation of plastic packages Kor, H. B. Chang, A. C. K. Gan, C. L. School of Materials Science & Engineering International Symposium on the Physical and Failure Analysis of Integrated Circuits (17th : 2010 : Singapore) DRNTU::Engineering::Materials Ablation was carried out on high voltage Schottky rectifiers at 25°C and -5°C (with a thermoelectric cooler or TEC), at 1.0 W and 3.9 W of laser power. In-situ measurement of the reverse current was conducted and correlated to the device junction temperature. It was found that the usage of a TEC increases the number of laser scans to reach the set current compliance of 100 μA after exposing the die, for ablation at 3.9 W, although eventual damage to the device is still unavoidable. The incorporation of a TEC below the sample is also demonstrated to be effective in reducing the device junction temperature during laser ablation. 2012-06-01T01:26:04Z 2019-12-06T19:01:01Z 2012-06-01T01:26:04Z 2019-12-06T19:01:01Z 2010 2010 Conference Paper Kor, H. B., Chang, A. C. K. & Gan, C. L. (2010). Temperature Control with a Thermoelectric Cooler (TEC) during Laser Decapsulation of Plastic Packages. In The 17th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), pp. 1-6. https://hdl.handle.net/10356/94719 http://hdl.handle.net/10220/8186 10.1109/IPFA.2010.5531987 160450 en © 2010 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: [DOI: http://dx.doi.org/10.1109/IPFA.2010.5531987 ] application/pdf |
institution |
Nanyang Technological University |
building |
NTU Library |
continent |
Asia |
country |
Singapore Singapore |
content_provider |
NTU Library |
collection |
DR-NTU |
language |
English |
topic |
DRNTU::Engineering::Materials |
spellingShingle |
DRNTU::Engineering::Materials Kor, H. B. Chang, A. C. K. Gan, C. L. Temperature control with a thermoelectric cooler (TEC) during laser decapsulation of plastic packages |
description |
Ablation was carried out on high voltage Schottky rectifiers at 25°C and -5°C (with a thermoelectric cooler or TEC), at 1.0 W and 3.9 W of laser power. In-situ measurement of the reverse current was conducted and correlated to the device junction temperature. It was found that the usage of a TEC increases the number of laser scans to reach the set current compliance of 100 μA after exposing the die, for ablation at 3.9 W, although eventual damage to the device is still unavoidable. The incorporation of a TEC below the sample is also demonstrated to be effective in reducing the device junction temperature during laser ablation. |
author2 |
School of Materials Science & Engineering |
author_facet |
School of Materials Science & Engineering Kor, H. B. Chang, A. C. K. Gan, C. L. |
format |
Conference or Workshop Item |
author |
Kor, H. B. Chang, A. C. K. Gan, C. L. |
author_sort |
Kor, H. B. |
title |
Temperature control with a thermoelectric cooler (TEC) during laser decapsulation of plastic packages |
title_short |
Temperature control with a thermoelectric cooler (TEC) during laser decapsulation of plastic packages |
title_full |
Temperature control with a thermoelectric cooler (TEC) during laser decapsulation of plastic packages |
title_fullStr |
Temperature control with a thermoelectric cooler (TEC) during laser decapsulation of plastic packages |
title_full_unstemmed |
Temperature control with a thermoelectric cooler (TEC) during laser decapsulation of plastic packages |
title_sort |
temperature control with a thermoelectric cooler (tec) during laser decapsulation of plastic packages |
publishDate |
2012 |
url |
https://hdl.handle.net/10356/94719 http://hdl.handle.net/10220/8186 |
_version_ |
1772827726493777920 |