Plasmon-enhanced polarized Raman spectroscopy for sensitive surface characterization

Local-mode and localized surface plasmons generated on the silver thin film can selectively enhance the Raman signal from the surface. Further improvement of surface signal can be obtained by using the polarized Raman technique that results in a dramatic enhancement of the surface sensitivity by up...

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Bibliographic Details
Main Authors: Ni, Zhenhua, Lee, Pooi See, Shen, Zexiang, Kasim, J., Tee, X. Y., You, Y. M., Setiawan, Y., Chan, L.
Other Authors: School of Materials Science & Engineering
Format: Article
Language:English
Published: 2012
Subjects:
Online Access:https://hdl.handle.net/10356/94736
http://hdl.handle.net/10220/8513
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Institution: Nanyang Technological University
Language: English
Description
Summary:Local-mode and localized surface plasmons generated on the silver thin film can selectively enhance the Raman signal from the surface. Further improvement of surface signal can be obtained by using the polarized Raman technique that results in a dramatic enhancement of the surface sensitivity by up to 25.4 times as compared to that without a silver coating. This technique will be very useful for Raman study on samples that suffer overlapping background signal. In this article, we show that it can be used to significantly improve the signal of thin strained-Si layer on top of SiGe buffer layer.