Plasmon-enhanced polarized Raman spectroscopy for sensitive surface characterization

Local-mode and localized surface plasmons generated on the silver thin film can selectively enhance the Raman signal from the surface. Further improvement of surface signal can be obtained by using the polarized Raman technique that results in a dramatic enhancement of the surface sensitivity by up...

Full description

Saved in:
Bibliographic Details
Main Authors: Ni, Zhenhua, Lee, Pooi See, Shen, Zexiang, Kasim, J., Tee, X. Y., You, Y. M., Setiawan, Y., Chan, L.
Other Authors: School of Materials Science & Engineering
Format: Article
Language:English
Published: 2012
Subjects:
Online Access:https://hdl.handle.net/10356/94736
http://hdl.handle.net/10220/8513
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: Nanyang Technological University
Language: English
id sg-ntu-dr.10356-94736
record_format dspace
spelling sg-ntu-dr.10356-947362020-06-01T10:21:17Z Plasmon-enhanced polarized Raman spectroscopy for sensitive surface characterization Ni, Zhenhua Lee, Pooi See Shen, Zexiang Kasim, J. Tee, X. Y. You, Y. M. Setiawan, Y. Chan, L. School of Materials Science & Engineering DRNTU::Engineering::Materials Local-mode and localized surface plasmons generated on the silver thin film can selectively enhance the Raman signal from the surface. Further improvement of surface signal can be obtained by using the polarized Raman technique that results in a dramatic enhancement of the surface sensitivity by up to 25.4 times as compared to that without a silver coating. This technique will be very useful for Raman study on samples that suffer overlapping background signal. In this article, we show that it can be used to significantly improve the signal of thin strained-Si layer on top of SiGe buffer layer. 2012-09-13T03:32:45Z 2019-12-06T19:01:14Z 2012-09-13T03:32:45Z 2019-12-06T19:01:14Z 2008 2008 Journal Article Kasim, J., Tee, X. Y., You, Y. M., Ni, Z. H., Setiawan, Y., Lee, P. S., et al. (2008). Plasmon-enhanced polarized Raman spectroscopy for sensitive surface characterization. Journal of raman spectroscopy, 39(10), 1338-1342. https://hdl.handle.net/10356/94736 http://hdl.handle.net/10220/8513 10.1002/jrs.1999 en Journal of Raman spectroscopy © 2008 John Wiley & Sons, Ltd.
institution Nanyang Technological University
building NTU Library
country Singapore
collection DR-NTU
language English
topic DRNTU::Engineering::Materials
spellingShingle DRNTU::Engineering::Materials
Ni, Zhenhua
Lee, Pooi See
Shen, Zexiang
Kasim, J.
Tee, X. Y.
You, Y. M.
Setiawan, Y.
Chan, L.
Plasmon-enhanced polarized Raman spectroscopy for sensitive surface characterization
description Local-mode and localized surface plasmons generated on the silver thin film can selectively enhance the Raman signal from the surface. Further improvement of surface signal can be obtained by using the polarized Raman technique that results in a dramatic enhancement of the surface sensitivity by up to 25.4 times as compared to that without a silver coating. This technique will be very useful for Raman study on samples that suffer overlapping background signal. In this article, we show that it can be used to significantly improve the signal of thin strained-Si layer on top of SiGe buffer layer.
author2 School of Materials Science & Engineering
author_facet School of Materials Science & Engineering
Ni, Zhenhua
Lee, Pooi See
Shen, Zexiang
Kasim, J.
Tee, X. Y.
You, Y. M.
Setiawan, Y.
Chan, L.
format Article
author Ni, Zhenhua
Lee, Pooi See
Shen, Zexiang
Kasim, J.
Tee, X. Y.
You, Y. M.
Setiawan, Y.
Chan, L.
author_sort Ni, Zhenhua
title Plasmon-enhanced polarized Raman spectroscopy for sensitive surface characterization
title_short Plasmon-enhanced polarized Raman spectroscopy for sensitive surface characterization
title_full Plasmon-enhanced polarized Raman spectroscopy for sensitive surface characterization
title_fullStr Plasmon-enhanced polarized Raman spectroscopy for sensitive surface characterization
title_full_unstemmed Plasmon-enhanced polarized Raman spectroscopy for sensitive surface characterization
title_sort plasmon-enhanced polarized raman spectroscopy for sensitive surface characterization
publishDate 2012
url https://hdl.handle.net/10356/94736
http://hdl.handle.net/10220/8513
_version_ 1681057427848429568