Discrimination of dendrimer aggregates on mica based on adhesion force : a pulsed force mode atomic force microscopy study

Two different types of aggregated polyphenylene dendrimer molecules, G2Td(COOH)16 and G4-Td, obtained by spin coating a dilute solution onto freshly cleaved mica surfaces, and their adhesion properties were measured by pulsed force mode (PFM) AFM. The adhesion properties could be related to the chem...

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Main Authors: Grim, P. C. M., Vosch, T., Wiesler, U. M., Berresheim, A. J., Müllen, K., De Schryver, F. C., Zhang, Hua
Other Authors: School of Materials Science & Engineering
Format: Article
Language:English
Published: 2012
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Online Access:https://hdl.handle.net/10356/95482
http://hdl.handle.net/10220/8531
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Institution: Nanyang Technological University
Language: English
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spelling sg-ntu-dr.10356-954822020-06-01T10:01:50Z Discrimination of dendrimer aggregates on mica based on adhesion force : a pulsed force mode atomic force microscopy study Grim, P. C. M. Vosch, T. Wiesler, U. M. Berresheim, A. J. Müllen, K. De Schryver, F. C. Zhang, Hua School of Materials Science & Engineering DRNTU::Engineering::Materials Two different types of aggregated polyphenylene dendrimer molecules, G2Td(COOH)16 and G4-Td, obtained by spin coating a dilute solution onto freshly cleaved mica surfaces, and their adhesion properties were measured by pulsed force mode (PFM) AFM. The adhesion properties could be related to the chemical nature of the outer surface of the dendrimers and the mica surface, and the thin film of water adsorbed on mica when imaged under ambient conditions. Most importantly, from the adhesion image of mixed aggregates of G2Td(COOH)16 and G4-Td, as measured by PFM-AFM, the two different aggregated dendrimers can be easily discriminated. 2012-09-14T03:28:18Z 2019-12-06T19:15:48Z 2012-09-14T03:28:18Z 2019-12-06T19:15:48Z 2000 2000 Journal Article Zhang, H., Grim, P. C. M., Vosch, T., Wiesler, U. M., Berresheim, A. J., Müllen, K., & De Schryver, F. C. (2000). Discrimination of dendrimer aggregates on mica based on adhesion force : a pulsed force mode atomic force microscopy study. Langmuir, 16(24), 9294-9298. 0743-7463 https://hdl.handle.net/10356/95482 http://hdl.handle.net/10220/8531 10.1021/la0008378 en Langmuir © 2000 American Chemical Society.
institution Nanyang Technological University
building NTU Library
country Singapore
collection DR-NTU
language English
topic DRNTU::Engineering::Materials
spellingShingle DRNTU::Engineering::Materials
Grim, P. C. M.
Vosch, T.
Wiesler, U. M.
Berresheim, A. J.
Müllen, K.
De Schryver, F. C.
Zhang, Hua
Discrimination of dendrimer aggregates on mica based on adhesion force : a pulsed force mode atomic force microscopy study
description Two different types of aggregated polyphenylene dendrimer molecules, G2Td(COOH)16 and G4-Td, obtained by spin coating a dilute solution onto freshly cleaved mica surfaces, and their adhesion properties were measured by pulsed force mode (PFM) AFM. The adhesion properties could be related to the chemical nature of the outer surface of the dendrimers and the mica surface, and the thin film of water adsorbed on mica when imaged under ambient conditions. Most importantly, from the adhesion image of mixed aggregates of G2Td(COOH)16 and G4-Td, as measured by PFM-AFM, the two different aggregated dendrimers can be easily discriminated.
author2 School of Materials Science & Engineering
author_facet School of Materials Science & Engineering
Grim, P. C. M.
Vosch, T.
Wiesler, U. M.
Berresheim, A. J.
Müllen, K.
De Schryver, F. C.
Zhang, Hua
format Article
author Grim, P. C. M.
Vosch, T.
Wiesler, U. M.
Berresheim, A. J.
Müllen, K.
De Schryver, F. C.
Zhang, Hua
author_sort Grim, P. C. M.
title Discrimination of dendrimer aggregates on mica based on adhesion force : a pulsed force mode atomic force microscopy study
title_short Discrimination of dendrimer aggregates on mica based on adhesion force : a pulsed force mode atomic force microscopy study
title_full Discrimination of dendrimer aggregates on mica based on adhesion force : a pulsed force mode atomic force microscopy study
title_fullStr Discrimination of dendrimer aggregates on mica based on adhesion force : a pulsed force mode atomic force microscopy study
title_full_unstemmed Discrimination of dendrimer aggregates on mica based on adhesion force : a pulsed force mode atomic force microscopy study
title_sort discrimination of dendrimer aggregates on mica based on adhesion force : a pulsed force mode atomic force microscopy study
publishDate 2012
url https://hdl.handle.net/10356/95482
http://hdl.handle.net/10220/8531
_version_ 1681059530297835520