Discrimination of dendrimer aggregates on mica based on adhesion force : a pulsed force mode atomic force microscopy study
Two different types of aggregated polyphenylene dendrimer molecules, G2Td(COOH)16 and G4-Td, obtained by spin coating a dilute solution onto freshly cleaved mica surfaces, and their adhesion properties were measured by pulsed force mode (PFM) AFM. The adhesion properties could be related to the chem...
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sg-ntu-dr.10356-954822020-06-01T10:01:50Z Discrimination of dendrimer aggregates on mica based on adhesion force : a pulsed force mode atomic force microscopy study Grim, P. C. M. Vosch, T. Wiesler, U. M. Berresheim, A. J. Müllen, K. De Schryver, F. C. Zhang, Hua School of Materials Science & Engineering DRNTU::Engineering::Materials Two different types of aggregated polyphenylene dendrimer molecules, G2Td(COOH)16 and G4-Td, obtained by spin coating a dilute solution onto freshly cleaved mica surfaces, and their adhesion properties were measured by pulsed force mode (PFM) AFM. The adhesion properties could be related to the chemical nature of the outer surface of the dendrimers and the mica surface, and the thin film of water adsorbed on mica when imaged under ambient conditions. Most importantly, from the adhesion image of mixed aggregates of G2Td(COOH)16 and G4-Td, as measured by PFM-AFM, the two different aggregated dendrimers can be easily discriminated. 2012-09-14T03:28:18Z 2019-12-06T19:15:48Z 2012-09-14T03:28:18Z 2019-12-06T19:15:48Z 2000 2000 Journal Article Zhang, H., Grim, P. C. M., Vosch, T., Wiesler, U. M., Berresheim, A. J., Müllen, K., & De Schryver, F. C. (2000). Discrimination of dendrimer aggregates on mica based on adhesion force : a pulsed force mode atomic force microscopy study. Langmuir, 16(24), 9294-9298. 0743-7463 https://hdl.handle.net/10356/95482 http://hdl.handle.net/10220/8531 10.1021/la0008378 en Langmuir © 2000 American Chemical Society. |
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DRNTU::Engineering::Materials Grim, P. C. M. Vosch, T. Wiesler, U. M. Berresheim, A. J. Müllen, K. De Schryver, F. C. Zhang, Hua Discrimination of dendrimer aggregates on mica based on adhesion force : a pulsed force mode atomic force microscopy study |
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Two different types of aggregated polyphenylene dendrimer molecules, G2Td(COOH)16 and G4-Td, obtained by spin coating a dilute solution onto freshly cleaved mica surfaces, and their adhesion properties were measured by pulsed force mode (PFM) AFM. The adhesion properties could be related to the chemical nature of the outer surface of the dendrimers and the mica surface, and the thin film of water adsorbed on mica when imaged under ambient conditions. Most importantly, from the adhesion image of mixed aggregates of G2Td(COOH)16 and G4-Td, as measured by PFM-AFM, the two different aggregated dendrimers can be easily discriminated. |
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School of Materials Science & Engineering |
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School of Materials Science & Engineering Grim, P. C. M. Vosch, T. Wiesler, U. M. Berresheim, A. J. Müllen, K. De Schryver, F. C. Zhang, Hua |
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Article |
author |
Grim, P. C. M. Vosch, T. Wiesler, U. M. Berresheim, A. J. Müllen, K. De Schryver, F. C. Zhang, Hua |
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Grim, P. C. M. |
title |
Discrimination of dendrimer aggregates on mica based on adhesion force : a pulsed force mode atomic force microscopy study |
title_short |
Discrimination of dendrimer aggregates on mica based on adhesion force : a pulsed force mode atomic force microscopy study |
title_full |
Discrimination of dendrimer aggregates on mica based on adhesion force : a pulsed force mode atomic force microscopy study |
title_fullStr |
Discrimination of dendrimer aggregates on mica based on adhesion force : a pulsed force mode atomic force microscopy study |
title_full_unstemmed |
Discrimination of dendrimer aggregates on mica based on adhesion force : a pulsed force mode atomic force microscopy study |
title_sort |
discrimination of dendrimer aggregates on mica based on adhesion force : a pulsed force mode atomic force microscopy study |
publishDate |
2012 |
url |
https://hdl.handle.net/10356/95482 http://hdl.handle.net/10220/8531 |
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1681059530297835520 |