The upper limit of thermoelectric figure of merit : importance of electronic thermoelectric efficiency

• Main Authors: Li, Jing, Yeung, Tin Cheung Au, Kam, Chan Hin
• 其他作者: School of Electrical and Electronic Engineering
• 格式: Article
• 語言: English
• 出版: 2013
• 主題: DRNTU::Engineering::Electrical and electronic engineering
• 在線閱讀: https://hdl.handle.net/10356/95864; http://hdl.handle.net/10220/11391

To improve thermoelectric (TE) efficiency, the physical phenomenon of TE effect is revisited. The important TE figure of merit (FOM) is expressed in terms of powers, and it is mapped by two fundamental quantities. One is the electronic TE efficiency, which is purely determined by a probability distr...