The upper limit of thermoelectric figure of merit : importance of electronic thermoelectric efficiency

• Main Authors: Li, Jing, Yeung, Tin Cheung Au, Kam, Chan Hin
• Other Authors: School of Electrical and Electronic Engineering
• Format: Article
• Language: English
• Published: 2013
• Subjects: DRNTU::Engineering::Electrical and electronic engineering
• Online Access: https://hdl.handle.net/10356/95864; http://hdl.handle.net/10220/11391
• Institution: Nanyang Technological University

To improve thermoelectric (TE) efficiency, the physical phenomenon of TE effect is revisited. The important TE figure of merit (FOM) is expressed in terms of powers, and it is mapped by two fundamental quantities. One is the electronic TE efficiency, which is purely determined by a probability distr...