Direct observation and analysis of annealing-induced microstructure at interface and its effect on performance improvement of organic thin film transistors

• Main Authors: Bao, Qiaoliang, Li, Jun, Li, Chang Ming, Dong, Zhili, Lu, Zhisong, Qin, Fang, Gong, Cheng, Guo, Jun
• Other Authors: School of Materials Science & Engineering
• Format: Article
• Language: English
• Published: 2011
• Subjects: DRNTU::Engineering::Materials::Microelectronics and semiconductor materials::Thin films
• Online Access: https://hdl.handle.net/10356/97124; http://hdl.handle.net/10220/7393
• Institution: Nanyang Technological University

For the first time direct observation and analysis of microstructural variations of crystalline domains and grain boundaries at atomic scale in the buried interface of an organic semiconductor thin film of poly(2,6-bis(3-alkylthiophen-2-yl)dithieno[3,2-b;2′,3′-d]thiophene) (PBTDT), a new synthesized...