Origin of hysteresis in the transfer characteristic of carbon nanotube field effect transistor
Using electrostatic force microscopy, we show direct evidence of charge injection at the carbon nanotube–SiO2 interface leading to the appearance of hysteresis. The dynamic screening effect of the injected charges is revealed step by step. Further temperature dependent tests also demonstrate the eff...
Saved in:
| Main Authors: | , , , , , , , , , |
|---|---|
| 其他作者: | |
| 格式: | Article |
| 語言: | English |
| 出版: |
2013
|
| 在線閱讀: | https://hdl.handle.net/10356/97319 http://hdl.handle.net/10220/10541 |
| 標簽: |
添加標簽
沒有標簽, 成為第一個標記此記錄!
|
| 機構: | Nanyang Technological University |
| 語言: | English |
| id |
sg-ntu-dr.10356-97319 |
|---|---|
| record_format |
dspace |
| spelling |
sg-ntu-dr.10356-973192020-06-01T10:21:14Z Origin of hysteresis in the transfer characteristic of carbon nanotube field effect transistor Ong, Hock Guan Cheah, Jun Wei Zou, X. Li, B. Cao, X. H. Tantang, Hosea Li, L.-J. Zhang, Hua Han, G. C. Wang, J. School of Materials Science & Engineering Using electrostatic force microscopy, we show direct evidence of charge injection at the carbon nanotube–SiO2 interface leading to the appearance of hysteresis. The dynamic screening effect of the injected charges is revealed step by step. Further temperature dependent tests also demonstrate the effect of SiO2 surface chemistry. Furthermore, we conclude that it is not practical to use such a device for memory application because of data retention and storage density issues. 2013-06-24T07:18:34Z 2019-12-06T19:41:26Z 2013-06-24T07:18:34Z 2019-12-06T19:41:26Z 2011 2011 Journal Article Ong, H. G., Cheah, J. W., Zou, X., Li, B., Cao, X. H., Tantang, H., et al. (2011). Origin of hysteresis in the transfer characteristic of carbon nanotube field effect transistor. Journal of physics D : applied physics, 44(28). 0022-3727 https://hdl.handle.net/10356/97319 http://hdl.handle.net/10220/10541 10.1088/0022-3727/44/28/285301 en Journal of physics D: applied physics © 2011 IOP Publishing Ltd. |
| institution |
Nanyang Technological University |
| building |
NTU Library |
| country |
Singapore |
| collection |
DR-NTU |
| language |
English |
| description |
Using electrostatic force microscopy, we show direct evidence of charge injection at the carbon nanotube–SiO2 interface leading to the appearance of hysteresis. The dynamic screening effect of the injected charges is revealed step by step. Further temperature dependent tests also demonstrate the effect of SiO2 surface chemistry. Furthermore, we conclude that it is not practical to use such a device for memory application because of data retention and storage density issues. |
| author2 |
School of Materials Science & Engineering |
| author_facet |
School of Materials Science & Engineering Ong, Hock Guan Cheah, Jun Wei Zou, X. Li, B. Cao, X. H. Tantang, Hosea Li, L.-J. Zhang, Hua Han, G. C. Wang, J. |
| format |
Article |
| author |
Ong, Hock Guan Cheah, Jun Wei Zou, X. Li, B. Cao, X. H. Tantang, Hosea Li, L.-J. Zhang, Hua Han, G. C. Wang, J. |
| spellingShingle |
Ong, Hock Guan Cheah, Jun Wei Zou, X. Li, B. Cao, X. H. Tantang, Hosea Li, L.-J. Zhang, Hua Han, G. C. Wang, J. Origin of hysteresis in the transfer characteristic of carbon nanotube field effect transistor |
| author_sort |
Ong, Hock Guan |
| title |
Origin of hysteresis in the transfer characteristic of carbon nanotube field effect transistor |
| title_short |
Origin of hysteresis in the transfer characteristic of carbon nanotube field effect transistor |
| title_full |
Origin of hysteresis in the transfer characteristic of carbon nanotube field effect transistor |
| title_fullStr |
Origin of hysteresis in the transfer characteristic of carbon nanotube field effect transistor |
| title_full_unstemmed |
Origin of hysteresis in the transfer characteristic of carbon nanotube field effect transistor |
| title_sort |
origin of hysteresis in the transfer characteristic of carbon nanotube field effect transistor |
| publishDate |
2013 |
| url |
https://hdl.handle.net/10356/97319 http://hdl.handle.net/10220/10541 |
| _version_ |
1681059312048275456 |