Origin of hysteresis in the transfer characteristic of carbon nanotube field effect transistor

• المؤلفون الرئيسيون: Ong, Hock Guan, Cheah, Jun Wei, Zou, X., Li, B., Cao, X. H., Tantang, Hosea, Li, L.-J., Zhang, Hua, Han, G. C., Wang, J.
• مؤلفون آخرون: School of Materials Science & Engineering
• التنسيق: مقال
• اللغة: English
• منشور في: 2013
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/97319; http://hdl.handle.net/10220/10541

Using electrostatic force microscopy, we show direct evidence of charge injection at the carbon nanotube–SiO2 interface leading to the appearance of hysteresis. The dynamic screening effect of the injected charges is revealed step by step. Further temperature dependent tests also demonstrate the eff...