Origin of hysteresis in the transfer characteristic of carbon nanotube field effect transistor

Using electrostatic force microscopy, we show direct evidence of charge injection at the carbon nanotube–SiO2 interface leading to the appearance of hysteresis. The dynamic screening effect of the injected charges is revealed step by step. Further temperature dependent tests also demonstrate the eff...

全面介紹

Saved in:
書目詳細資料
Main Authors: Ong, Hock Guan, Cheah, Jun Wei, Zou, X., Li, B., Cao, X. H., Tantang, Hosea, Li, L.-J., Zhang, Hua, Han, G. C., Wang, J.
其他作者: School of Materials Science & Engineering
格式: Article
語言:English
出版: 2013
在線閱讀:https://hdl.handle.net/10356/97319
http://hdl.handle.net/10220/10541
標簽: 添加標簽
沒有標簽, 成為第一個標記此記錄!
機構: Nanyang Technological University
語言: English