Impact ionization and auger recombination rates in semiconductor quantum dots

Impact ionization and Auger recombination in nanoscale spherical quantum dots (QDs) have been studied theoretically. It is shown that due to the strong quantum confinement of both electrons in the conduction band and holes in the valence band, impact ionization and Auger recombination energies in th...

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Main Authors: Fu, Ying, Zhou, Y. H., Su, Haibin, Boey, Freddy Yin Chiang, Ågren, Hans
Other Authors: School of Materials Science & Engineering
Format: Article
Language:English
Published: 2011
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Online Access:https://hdl.handle.net/10356/98411
http://hdl.handle.net/10220/7429
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Institution: Nanyang Technological University
Language: English
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spelling sg-ntu-dr.10356-984112020-06-01T10:13:44Z Impact ionization and auger recombination rates in semiconductor quantum dots Fu, Ying Zhou, Y. H. Su, Haibin Boey, Freddy Yin Chiang Ågren, Hans School of Materials Science & Engineering DRNTU::Engineering::Materials::Microelectronics and semiconductor materials Impact ionization and Auger recombination in nanoscale spherical quantum dots (QDs) have been studied theoretically. It is shown that due to the strong quantum confinement of both electrons in the conduction band and holes in the valence band, impact ionization and Auger recombination energies in these QDs can be on the order of a few millielectronvolts when various selection rules are fulfilled, which are much higher than spontaneous radiative emission energies. This explains the experimentally reported high occurrence rates of the multiple exciton generation (MEG) effect in QDs. However, due to quantum confinement, the energy states are discrete in QDs, especially for low-energy states where the densities of states are low. This implies that only a limited number of high-energy electron states can interact with (i.e., impact ionize) low-energy hole states in QDs having certain values of radii due to the energy conservation requirement. This explains the vastly scattered experimental data and difficulties in utilizing the MEG effect in practice. Accepted version 2011-12-21T02:39:41Z 2019-12-06T19:54:57Z 2011-12-21T02:39:41Z 2019-12-06T19:54:57Z 2010 2010 Journal Article Fu, Y., Zhou, Y. H., Su, H., Boey, F. Y. C., & Ågren, H. (2010). Impact ionization and auger recombination rates in semiconductor quantum dots. Journal of physical chemistry C, 114 (9), 3743–3747. https://hdl.handle.net/10356/98411 http://hdl.handle.net/10220/7429 10.1021/jp9082486 en Journal of physical chemistry C © 2010 American Chemical Society.
institution Nanyang Technological University
building NTU Library
country Singapore
collection DR-NTU
language English
topic DRNTU::Engineering::Materials::Microelectronics and semiconductor materials
spellingShingle DRNTU::Engineering::Materials::Microelectronics and semiconductor materials
Fu, Ying
Zhou, Y. H.
Su, Haibin
Boey, Freddy Yin Chiang
Ågren, Hans
Impact ionization and auger recombination rates in semiconductor quantum dots
description Impact ionization and Auger recombination in nanoscale spherical quantum dots (QDs) have been studied theoretically. It is shown that due to the strong quantum confinement of both electrons in the conduction band and holes in the valence band, impact ionization and Auger recombination energies in these QDs can be on the order of a few millielectronvolts when various selection rules are fulfilled, which are much higher than spontaneous radiative emission energies. This explains the experimentally reported high occurrence rates of the multiple exciton generation (MEG) effect in QDs. However, due to quantum confinement, the energy states are discrete in QDs, especially for low-energy states where the densities of states are low. This implies that only a limited number of high-energy electron states can interact with (i.e., impact ionize) low-energy hole states in QDs having certain values of radii due to the energy conservation requirement. This explains the vastly scattered experimental data and difficulties in utilizing the MEG effect in practice.
author2 School of Materials Science & Engineering
author_facet School of Materials Science & Engineering
Fu, Ying
Zhou, Y. H.
Su, Haibin
Boey, Freddy Yin Chiang
Ågren, Hans
format Article
author Fu, Ying
Zhou, Y. H.
Su, Haibin
Boey, Freddy Yin Chiang
Ågren, Hans
author_sort Fu, Ying
title Impact ionization and auger recombination rates in semiconductor quantum dots
title_short Impact ionization and auger recombination rates in semiconductor quantum dots
title_full Impact ionization and auger recombination rates in semiconductor quantum dots
title_fullStr Impact ionization and auger recombination rates in semiconductor quantum dots
title_full_unstemmed Impact ionization and auger recombination rates in semiconductor quantum dots
title_sort impact ionization and auger recombination rates in semiconductor quantum dots
publishDate 2011
url https://hdl.handle.net/10356/98411
http://hdl.handle.net/10220/7429
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