Compressive sampling methods for superresolution imaging
We investigate superresolution imaging using negative index metamaterials. Measurement of subwavelength scale features in the image domain is tedious and compressive sampling techniques are considered to alleviate this problem. A single detector (c.f. a single pixel camera geometry) is considered fr...
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| Main Authors: | , , |
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| Other Authors: | |
| Format: | Conference or Workshop Item |
| Language: | English |
| Published: |
2013
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| Online Access: | https://hdl.handle.net/10356/99092 http://hdl.handle.net/10220/12695 |
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| Institution: | Nanyang Technological University |
| Language: | English |
| Summary: | We investigate superresolution imaging using negative index metamaterials. Measurement of subwavelength scale features in the image domain is tedious and compressive sampling techniques are considered to alleviate this problem. A single detector (c.f. a single pixel camera geometry) is considered from which a high resolution image can be computed, which makes use of structured illumination for coding. |
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