Compressive sampling methods for superresolution imaging

Compressive sampling methods for superresolution imaging

We investigate superresolution imaging using negative index metamaterials. Measurement of subwavelength scale features in the image domain is tedious and compressive sampling techniques are considered to alleviate this problem. A single detector (c.f. a single pixel camera geometry) is considered fr...

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Main Authors: Fiddy, Michael A., Chuang, Yi-Chen, Dudley, Richard
Other Authors: School of Electrical and Electronic Engineering
Format: Conference or Workshop Item
Language:English
Published: 2013
Online Access:https://hdl.handle.net/10356/99092
http://hdl.handle.net/10220/12695
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Institution: Nanyang Technological University
Language: English
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spelling sg-ntu-dr.10356-990922020-03-07T13:24:49Z Compressive sampling methods for superresolution imaging Fiddy, Michael A. Chuang, Yi-Chen Dudley, Richard School of Electrical and Electronic Engineering Image Reconstruction from Incomplete Data (7th : 2012 : San Diego, US) We investigate superresolution imaging using negative index metamaterials. Measurement of subwavelength scale features in the image domain is tedious and compressive sampling techniques are considered to alleviate this problem. A single detector (c.f. a single pixel camera geometry) is considered from which a high resolution image can be computed, which makes use of structured illumination for coding. Published version 2013-08-01T01:51:16Z 2019-12-06T20:03:14Z 2013-08-01T01:51:16Z 2019-12-06T20:03:14Z 2012 2012 Conference Paper Chuang, Y. C., Dudley, R., & Fiddy, M. A. (2012). Compressive sampling methods for superresolution imaging. Proceedings of SPIE - Image Reconstruction from Incomplete Data VII, 850005. https://hdl.handle.net/10356/99092 http://hdl.handle.net/10220/12695 10.1117/12.930837 en © 2012 SPIE. This paper was published in Proceedings of SPIE - Image Reconstruction from Incomplete Data VII and is made available as an electronic reprint (preprint) with permission of SPIE. The paper can be found at the following official DOI: [http://dx.doi.org/10.1117/12.930837]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law. application/pdf
institution Nanyang Technological University
building NTU Library
country Singapore
collection DR-NTU
language English
description We investigate superresolution imaging using negative index metamaterials. Measurement of subwavelength scale features in the image domain is tedious and compressive sampling techniques are considered to alleviate this problem. A single detector (c.f. a single pixel camera geometry) is considered from which a high resolution image can be computed, which makes use of structured illumination for coding.
author2 School of Electrical and Electronic Engineering
author_facet School of Electrical and Electronic Engineering
Fiddy, Michael A.
Chuang, Yi-Chen
Dudley, Richard
format Conference or Workshop Item
author Fiddy, Michael A.
Chuang, Yi-Chen
Dudley, Richard
spellingShingle Fiddy, Michael A.
Chuang, Yi-Chen
Dudley, Richard
Compressive sampling methods for superresolution imaging
author_sort Fiddy, Michael A.
title Compressive sampling methods for superresolution imaging
title_short Compressive sampling methods for superresolution imaging
title_full Compressive sampling methods for superresolution imaging
title_fullStr Compressive sampling methods for superresolution imaging
title_full_unstemmed Compressive sampling methods for superresolution imaging
title_sort compressive sampling methods for superresolution imaging
publishDate 2013
url https://hdl.handle.net/10356/99092
http://hdl.handle.net/10220/12695
_version_ 1681044880865886208

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