Nanoscale domains in strained epitaxial BiFeO3 thin Films on LaSrAlO4 substrate

• المؤلفون الرئيسيون: Chen, Zuhuang, You, Lu, Huang, Chuanwei, Qi, Yajun, Wang, Junling, Sritharan, Thirumany, Chen, Lang
• مؤلفون آخرون: School of Materials Science & Engineering
• التنسيق: مقال
• اللغة: English
• منشور في: 2011
• الموضوعات: DRNTU::Engineering::Materials::Magnetic materials; DRNTU::Engineering::Materials::Microelectronics and semiconductor materials::Thin films
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/99909; http://hdl.handle.net/10220/6928

BiFeO3 thin films with various thicknesses were grown epitaxially on (001) LaSrAlO4 single crystal substrates using pulsed laser deposition. High resolution x-ray diffraction measurements revealed that a tetragonal-like phase with c-lattice constant -4.65 Å is stabilized by a large misfit strain. Be...