Nanoscale domains in strained epitaxial BiFeO3 thin Films on LaSrAlO4 substrate

BiFeO3 thin films with various thicknesses were grown epitaxially on (001) LaSrAlO4 single crystal substrates using pulsed laser deposition. High resolution x-ray diffraction measurements revealed that a tetragonal-like phase with c-lattice constant -4.65 Å is stabilized by a large misfit strain. Be...

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Bibliographic Details
Main Authors: Chen, Zuhuang, You, Lu, Huang, Chuanwei, Qi, Yajun, Wang, Junling, Sritharan, Thirumany, Chen, Lang
Other Authors: School of Materials Science & Engineering
Format: Article
Language:English
Published: 2011
Subjects:
Online Access:https://hdl.handle.net/10356/99909
http://hdl.handle.net/10220/6928
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Institution: Nanyang Technological University
Language: English
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