Computing average run lengths of exponential EWMA charts

Journal of Quality Technology

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Bibliographic Details
Main Authors: Gan, F.F., Chang, T.C.
Other Authors: STATISTICS & APPLIED PROBABILITY
Format: Article
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/105066
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Institution: National University of Singapore
Description
Summary:Journal of Quality Technology