Computing average run lengths of exponential EWMA charts
Journal of Quality Technology
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Main Authors: | Gan, F.F., Chang, T.C. |
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Other Authors: | STATISTICS & APPLIED PROBABILITY |
Format: | Article |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/105066 |
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Institution: | National University of Singapore |
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