Detecting over rejection in testing of integrated circuits

Detecting over rejection in testing of integrated circuits

Journal of Quality Technology

Saved in:
Bibliographic Details
Main Authors: Chang, T.C., Gan, F.F.
Other Authors: STATISTICS & APPLIED PROBABILITY
Format: Article
Published: 2014
Subjects:
Bernoulli distribution
Binomial distribution
Cumulative sum control charts
Statistical process control
Online Access:http://scholarbank.nus.edu.sg/handle/10635/105087
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore
Description
Summary:Journal of Quality Technology

Similar Items