Detecting over rejection in testing of integrated circuits
Journal of Quality Technology
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2014
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sg-nus-scholar.10635-1050872024-11-08T16:44:04Z Detecting over rejection in testing of integrated circuits Chang, T.C. Gan, F.F. STATISTICS & APPLIED PROBABILITY Bernoulli distribution Binomial distribution Cumulative sum control charts Statistical process control Journal of Quality Technology 33 3 356-364 JQUTA 2014-10-28T05:11:13Z 2014-10-28T05:11:13Z 2001-07 Article Chang, T.C.,Gan, F.F. (2001-07). Detecting over rejection in testing of integrated circuits. Journal of Quality Technology 33 (3) : 356-364. ScholarBank@NUS Repository. 00224065 http://scholarbank.nus.edu.sg/handle/10635/105087 NOT_IN_WOS Scopus |
| institution |
National University of Singapore |
| building |
NUS Library |
| continent |
Asia |
| country |
Singapore Singapore |
| content_provider |
NUS Library |
| collection |
ScholarBank@NUS |
| topic |
Bernoulli distribution Binomial distribution Cumulative sum control charts Statistical process control |
| spellingShingle |
Bernoulli distribution Binomial distribution Cumulative sum control charts Statistical process control Chang, T.C. Gan, F.F. Detecting over rejection in testing of integrated circuits |
| description |
Journal of Quality Technology |
| author2 |
STATISTICS & APPLIED PROBABILITY |
| author_facet |
STATISTICS & APPLIED PROBABILITY Chang, T.C. Gan, F.F. |
| format |
Article |
| author |
Chang, T.C. Gan, F.F. |
| author_sort |
Chang, T.C. |
| title |
Detecting over rejection in testing of integrated circuits |
| title_short |
Detecting over rejection in testing of integrated circuits |
| title_full |
Detecting over rejection in testing of integrated circuits |
| title_fullStr |
Detecting over rejection in testing of integrated circuits |
| title_full_unstemmed |
Detecting over rejection in testing of integrated circuits |
| title_sort |
detecting over rejection in testing of integrated circuits |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/105087 |
| _version_ |
1821202626401796096 |