Detecting over rejection in testing of integrated circuits

Journal of Quality Technology

Saved in:

Bibliographic Details
Main Authors:	Chang, T.C., Gan, F.F.
Other Authors:	STATISTICS & APPLIED PROBABILITY
Format:	Article
Published:	2014
Subjects:	Bernoulli distribution Binomial distribution Cumulative sum control charts Statistical process control
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/105087
Tags:	Add Tag No Tags, Be the first to tag this record!
Institution:	National University of Singapore

id	sg-nus-scholar.10635-105087
record_format	dspace
spelling	sg-nus-scholar.10635-1050872015-01-07T17:10:33Z Detecting over rejection in testing of integrated circuits Chang, T.C. Gan, F.F. STATISTICS & APPLIED PROBABILITY Bernoulli distribution Binomial distribution Cumulative sum control charts Statistical process control Journal of Quality Technology 33 3 356-364 JQUTA 2014-10-28T05:11:13Z 2014-10-28T05:11:13Z 2001-07 Article Chang, T.C.,Gan, F.F. (2001-07). Detecting over rejection in testing of integrated circuits. Journal of Quality Technology 33 (3) : 356-364. ScholarBank@NUS Repository. 00224065 http://scholarbank.nus.edu.sg/handle/10635/105087 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
topic	Bernoulli distribution Binomial distribution Cumulative sum control charts Statistical process control
spellingShingle	Bernoulli distribution Binomial distribution Cumulative sum control charts Statistical process control Chang, T.C. Gan, F.F. Detecting over rejection in testing of integrated circuits
description	Journal of Quality Technology
author2	STATISTICS & APPLIED PROBABILITY
author_facet	STATISTICS & APPLIED PROBABILITY Chang, T.C. Gan, F.F.
format	Article
author	Chang, T.C. Gan, F.F.
author_sort	Chang, T.C.
title	Detecting over rejection in testing of integrated circuits
title_short	Detecting over rejection in testing of integrated circuits
title_full	Detecting over rejection in testing of integrated circuits
title_fullStr	Detecting over rejection in testing of integrated circuits
title_full_unstemmed	Detecting over rejection in testing of integrated circuits
title_sort	detecting over rejection in testing of integrated circuits
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/105087
_version_	1681093223546617856

Detecting over rejection in testing of integrated circuits

Similar Items