Measurement errors in line transect surveys where detectability varies with distance and size

Measurement errors in line transect surveys where detectability varies with distance and size

Biometrics

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Bibliographic Details
Main Authors: Chen, S.X., Cowling, A.
Other Authors: STATISTICS & APPLIED PROBABILITY
Format: Article
Published: 2014
Subjects:
Detectability
Line transect surveys
Measurement error
Method of moments
Parametric models
Size bias
Online Access:http://scholarbank.nus.edu.sg/handle/10635/105218
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Institution: National University of Singapore
Description
Summary:Biometrics

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