Modified shewhart charts for high yield processes

10.1080/02664760701546279

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Bibliographic Details
Main Authors:	Chang, T.C., Gan, F.F.
Other Authors:	STATISTICS & APPLIED PROBABILITY
Format:	Review
Published:	2014
Subjects:	Average run length Binomial counts Parts-per-million non-conforming items Statistical process control Supplementary runs rules
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/105500
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Institution:	National University of Singapore

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Summary:	10.1080/02664760701546279

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