Modified shewhart charts for high yield processes
10.1080/02664760701546279
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2014
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sg-nus-scholar.10635-1055002023-11-01T07:18:25Z Modified shewhart charts for high yield processes Chang, T.C. Gan, F.F. STATISTICS & APPLIED PROBABILITY Average run length Binomial counts Parts-per-million non-conforming items Statistical process control Supplementary runs rules 10.1080/02664760701546279 Journal of Applied Statistics 34 7 857-877 2014-10-28T05:17:00Z 2014-10-28T05:17:00Z 2007-09 Review Chang, T.C., Gan, F.F. (2007-09). Modified shewhart charts for high yield processes. Journal of Applied Statistics 34 (7) : 857-877. ScholarBank@NUS Repository. https://doi.org/10.1080/02664760701546279 02664763 http://scholarbank.nus.edu.sg/handle/10635/105500 000249261300008 Scopus |
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Average run length Binomial counts Parts-per-million non-conforming items Statistical process control Supplementary runs rules |
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Average run length Binomial counts Parts-per-million non-conforming items Statistical process control Supplementary runs rules Chang, T.C. Gan, F.F. Modified shewhart charts for high yield processes |
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10.1080/02664760701546279 |
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STATISTICS & APPLIED PROBABILITY |
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STATISTICS & APPLIED PROBABILITY Chang, T.C. Gan, F.F. |
format |
Review |
author |
Chang, T.C. Gan, F.F. |
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Chang, T.C. |
title |
Modified shewhart charts for high yield processes |
title_short |
Modified shewhart charts for high yield processes |
title_full |
Modified shewhart charts for high yield processes |
title_fullStr |
Modified shewhart charts for high yield processes |
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Modified shewhart charts for high yield processes |
title_sort |
modified shewhart charts for high yield processes |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/105500 |
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