Exchange bias on epitaxial Ni films due to ultrathin NiO layer

10.1140/epjb/e2005-00183-6

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Bibliographic Details
Main Authors:	Lukaszew, R.A., Mitra, M., Zhang, Z., Yeadon, M.
Other Authors:	MATERIALS SCIENCE
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/107035
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Institution:	National University of Singapore

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Summary:	10.1140/epjb/e2005-00183-6

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