Exchange bias on epitaxial Ni films due to ultrathin NiO layer
10.1140/epjb/e2005-00183-6
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Main Authors: | Lukaszew, R.A., Mitra, M., Zhang, Z., Yeadon, M. |
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Other Authors: | MATERIALS SCIENCE |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/107035 |
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Institution: | National University of Singapore |
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