Internal Atomic Distortion and Layer Roughness of Epitaxial SiC Thin Films Studied by Short Wavelength X-Ray Diffraction

Physical Review Letters

Saved in:
Bibliographic Details
Main Authors: Xu, G., Feng, Z.C.
Other Authors: MATERIALS SCIENCE
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/107083
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore