Microstructure analysis of annealing effect on CoCrPt thin film media by XRD
IEICE Transactions on Electronics
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sg-nus-scholar.10635-1071212015-02-20T23:41:57Z Microstructure analysis of annealing effect on CoCrPt thin film media by XRD Jin, D. Su, Y. Wang, J.P. Gong, H. MATERIALS SCIENCE IEICE Transactions on Electronics E83-C 9 1473-1477 IELEE 2014-10-29T08:39:47Z 2014-10-29T08:39:47Z 2000-09 Article Jin, D.,Su, Y.,Wang, J.P.,Gong, H. (2000-09). Microstructure analysis of annealing effect on CoCrPt thin film media by XRD. IEICE Transactions on Electronics E83-C (9) : 1473-1477. ScholarBank@NUS Repository. 09168524 http://scholarbank.nus.edu.sg/handle/10635/107121 NOT_IN_WOS Scopus |
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IEICE Transactions on Electronics |
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MATERIALS SCIENCE |
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MATERIALS SCIENCE Jin, D. Su, Y. Wang, J.P. Gong, H. |
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Jin, D. Su, Y. Wang, J.P. Gong, H. |
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Jin, D. Su, Y. Wang, J.P. Gong, H. Microstructure analysis of annealing effect on CoCrPt thin film media by XRD |
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Jin, D. |
title |
Microstructure analysis of annealing effect on CoCrPt thin film media by XRD |
title_short |
Microstructure analysis of annealing effect on CoCrPt thin film media by XRD |
title_full |
Microstructure analysis of annealing effect on CoCrPt thin film media by XRD |
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Microstructure analysis of annealing effect on CoCrPt thin film media by XRD |
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Microstructure analysis of annealing effect on CoCrPt thin film media by XRD |
title_sort |
microstructure analysis of annealing effect on cocrpt thin film media by xrd |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/107121 |
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