Microstructure analysis of annealing effect on CoCrPt thin film media by XRD

IEICE Transactions on Electronics

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Main Authors: Jin, D., Su, Y., Wang, J.P., Gong, H.
Other Authors: MATERIALS SCIENCE
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/107121
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-1071212015-02-20T23:41:57Z Microstructure analysis of annealing effect on CoCrPt thin film media by XRD Jin, D. Su, Y. Wang, J.P. Gong, H. MATERIALS SCIENCE IEICE Transactions on Electronics E83-C 9 1473-1477 IELEE 2014-10-29T08:39:47Z 2014-10-29T08:39:47Z 2000-09 Article Jin, D.,Su, Y.,Wang, J.P.,Gong, H. (2000-09). Microstructure analysis of annealing effect on CoCrPt thin film media by XRD. IEICE Transactions on Electronics E83-C (9) : 1473-1477. ScholarBank@NUS Repository. 09168524 http://scholarbank.nus.edu.sg/handle/10635/107121 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
description IEICE Transactions on Electronics
author2 MATERIALS SCIENCE
author_facet MATERIALS SCIENCE
Jin, D.
Su, Y.
Wang, J.P.
Gong, H.
format Article
author Jin, D.
Su, Y.
Wang, J.P.
Gong, H.
spellingShingle Jin, D.
Su, Y.
Wang, J.P.
Gong, H.
Microstructure analysis of annealing effect on CoCrPt thin film media by XRD
author_sort Jin, D.
title Microstructure analysis of annealing effect on CoCrPt thin film media by XRD
title_short Microstructure analysis of annealing effect on CoCrPt thin film media by XRD
title_full Microstructure analysis of annealing effect on CoCrPt thin film media by XRD
title_fullStr Microstructure analysis of annealing effect on CoCrPt thin film media by XRD
title_full_unstemmed Microstructure analysis of annealing effect on CoCrPt thin film media by XRD
title_sort microstructure analysis of annealing effect on cocrpt thin film media by xrd
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/107121
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