Microstructure analysis of annealing effect on CoCrPt thin film media by XRD

IEICE Transactions on Electronics

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Bibliographic Details
Main Authors: Jin, D., Su, Y., Wang, J.P., Gong, H.
Other Authors: MATERIALS SCIENCE
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/107121
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Institution: National University of Singapore
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