Thin films: Stress, strain and structure-property relations

10.1016/S0040-6090(02)00899-4

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Bibliographic Details
Main Authors:	Yeadon, M., Kaiyang, Z., Hoon, H.H., Twesten, R.D., Abothu, R.
Other Authors:	MATERIALS SCIENCE
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/107322
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Institution:	National University of Singapore

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