Thin films: Stress, strain and structure-property relations
10.1016/S0040-6090(02)00899-4
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Main Authors: | Yeadon, M., Kaiyang, Z., Hoon, H.H., Twesten, R.D., Abothu, R. |
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Other Authors: | MATERIALS SCIENCE |
Format: | Conference or Workshop Item |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/107322 |
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Institution: | National University of Singapore |
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