Structural and magnetoresistive properties of half metallic Co2Mn1-xSi thin films

Structural and magnetoresistive properties of half metallic Co2Mn1-xSi thin films

10.1016/j.jmmm.2006.01.136

Saved in:
Bibliographic Details
Main Authors: Li, K.B., Qiu, J.J., Luo, P., An, L.H., Guo, Z.B., Zheng, Y.K., Han, G.C., Wu, Y.H., Wang, S.J.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
Half metals
Heusler alloy
Magnetic tunneling junction
Thermal stability
Online Access:http://scholarbank.nus.edu.sg/handle/10635/83093
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/83093

Similar Items