Structural and magnetoresistive properties of half metallic Co2Mn1-xSi thin films

• Main Authors: Li, K.B., Qiu, J.J., Luo, P., An, L.H., Guo, Z.B., Zheng, Y.K., Han, G.C., Wu, Y.H., Wang, S.J.
• 其他作者: ELECTRICAL & COMPUTER ENGINEERING
• 格式: Article
• 出版: 2014
• 主題: Half metals; Heusler alloy; Magnetic tunneling junction; Thermal stability
• 在線閱讀: http://scholarbank.nus.edu.sg/handle/10635/83093

10.1016/j.jmmm.2006.01.136