Structural and magnetoresistive properties of half metallic Co2Mn1-xSi thin films

• Main Authors: Li, K.B., Qiu, J.J., Luo, P., An, L.H., Guo, Z.B., Zheng, Y.K., Han, G.C., Wu, Y.H., Wang, S.J.
• Other Authors: ELECTRICAL & COMPUTER ENGINEERING
• Format: Article
• Published: 2014
• Subjects: Half metals; Heusler alloy; Magnetic tunneling junction; Thermal stability
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/83093
• Institution: National University of Singapore

10.1016/j.jmmm.2006.01.136