Structural and magnetoresistive properties of half metallic Co2Mn1-xSi thin films
10.1016/j.jmmm.2006.01.136
محفوظ في:
| المؤلفون الرئيسيون: | , , , , , , , , |
|---|---|
| مؤلفون آخرون: | |
| التنسيق: | مقال |
| منشور في: |
2014
|
| الموضوعات: | |
| الوصول للمادة أونلاين: | http://scholarbank.nus.edu.sg/handle/10635/83093 |
| الوسوم: |
إضافة وسم
لا توجد وسوم, كن أول من يضع وسما على هذه التسجيلة!
|
| المؤسسة: | National University of Singapore |
| id |
sg-nus-scholar.10635-83093 |
|---|---|
| record_format |
dspace |
| spelling |
sg-nus-scholar.10635-830932024-11-09T04:50:51Z Structural and magnetoresistive properties of half metallic Co2Mn1-xSi thin films Li, K.B. Qiu, J.J. Luo, P. An, L.H. Guo, Z.B. Zheng, Y.K. Han, G.C. Wu, Y.H. Wang, S.J. ELECTRICAL & COMPUTER ENGINEERING Half metals Heusler alloy Magnetic tunneling junction Thermal stability 10.1016/j.jmmm.2006.01.136 Journal of Magnetism and Magnetic Materials 303 2 SPEC. ISS. e196-e200 JMMMD 2014-10-07T04:37:11Z 2014-10-07T04:37:11Z 2006-08 Article Li, K.B., Qiu, J.J., Luo, P., An, L.H., Guo, Z.B., Zheng, Y.K., Han, G.C., Wu, Y.H., Wang, S.J. (2006-08). Structural and magnetoresistive properties of half metallic Co2Mn1-xSi thin films. Journal of Magnetism and Magnetic Materials 303 (2 SPEC. ISS.) : e196-e200. ScholarBank@NUS Repository. https://doi.org/10.1016/j.jmmm.2006.01.136 03048853 http://scholarbank.nus.edu.sg/handle/10635/83093 000208249000043 Scopus |
| institution |
National University of Singapore |
| building |
NUS Library |
| continent |
Asia |
| country |
Singapore Singapore |
| content_provider |
NUS Library |
| collection |
ScholarBank@NUS |
| topic |
Half metals Heusler alloy Magnetic tunneling junction Thermal stability |
| spellingShingle |
Half metals Heusler alloy Magnetic tunneling junction Thermal stability Li, K.B. Qiu, J.J. Luo, P. An, L.H. Guo, Z.B. Zheng, Y.K. Han, G.C. Wu, Y.H. Wang, S.J. Structural and magnetoresistive properties of half metallic Co2Mn1-xSi thin films |
| description |
10.1016/j.jmmm.2006.01.136 |
| author2 |
ELECTRICAL & COMPUTER ENGINEERING |
| author_facet |
ELECTRICAL & COMPUTER ENGINEERING Li, K.B. Qiu, J.J. Luo, P. An, L.H. Guo, Z.B. Zheng, Y.K. Han, G.C. Wu, Y.H. Wang, S.J. |
| format |
Article |
| author |
Li, K.B. Qiu, J.J. Luo, P. An, L.H. Guo, Z.B. Zheng, Y.K. Han, G.C. Wu, Y.H. Wang, S.J. |
| author_sort |
Li, K.B. |
| title |
Structural and magnetoresistive properties of half metallic Co2Mn1-xSi thin films |
| title_short |
Structural and magnetoresistive properties of half metallic Co2Mn1-xSi thin films |
| title_full |
Structural and magnetoresistive properties of half metallic Co2Mn1-xSi thin films |
| title_fullStr |
Structural and magnetoresistive properties of half metallic Co2Mn1-xSi thin films |
| title_full_unstemmed |
Structural and magnetoresistive properties of half metallic Co2Mn1-xSi thin films |
| title_sort |
structural and magnetoresistive properties of half metallic co2mn1-xsi thin films |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/83093 |
| _version_ |
1821232294029950976 |