Erratum: Error correction for diffraction and multiple scattering in free-space microwave measurement of materials (IEEE Transactions on Microwave Theory and Techniques (2006) 54:2 (648-659))

10.1109/TMTT.2006.871948

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Bibliographic Details
Main Author: Hock, K.M.
Other Authors: TEMASEK LABORATORIES
Format: Others
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/111661
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Institution: National University of Singapore
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