Erratum: Error correction for diffraction and multiple scattering in free-space microwave measurement of materials (IEEE Transactions on Microwave Theory and Techniques (2006) 54:2 (648-659))
10.1109/TMTT.2006.871948
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Main Author: | Hock, K.M. |
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Other Authors: | TEMASEK LABORATORIES |
Format: | Others |
Published: |
2014
|
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/111661 |
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Institution: | National University of Singapore |
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