Spatially resolved diagnosis of stress-induced breakdown in oxide dots by in situ conducting atomic force microscopy
10.1063/1.1846955
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sg-nus-scholar.10635-1126512023-10-27T09:07:25Z Spatially resolved diagnosis of stress-induced breakdown in oxide dots by in situ conducting atomic force microscopy Xie, X.N. Chung, H.J. Sow, C.H. Wee, A.T.S. PHYSICS NUS NANOSCIENCE & NANOTECH INITIATIVE 10.1063/1.1846955 Applied Physics Letters 86 2 023112-1 APPLA 2014-11-28T06:33:55Z 2014-11-28T06:33:55Z 2005-01-10 Article Xie, X.N., Chung, H.J., Sow, C.H., Wee, A.T.S. (2005-01-10). Spatially resolved diagnosis of stress-induced breakdown in oxide dots by in situ conducting atomic force microscopy. Applied Physics Letters 86 (2) : 023112-1. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1846955 00036951 http://scholarbank.nus.edu.sg/handle/10635/112651 000226701500074 Scopus |
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National University of Singapore |
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Asia |
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Singapore Singapore |
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NUS Library |
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ScholarBank@NUS |
| description |
10.1063/1.1846955 |
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PHYSICS |
| author_facet |
PHYSICS Xie, X.N. Chung, H.J. Sow, C.H. Wee, A.T.S. |
| format |
Article |
| author |
Xie, X.N. Chung, H.J. Sow, C.H. Wee, A.T.S. |
| spellingShingle |
Xie, X.N. Chung, H.J. Sow, C.H. Wee, A.T.S. Spatially resolved diagnosis of stress-induced breakdown in oxide dots by in situ conducting atomic force microscopy |
| author_sort |
Xie, X.N. |
| title |
Spatially resolved diagnosis of stress-induced breakdown in oxide dots by in situ conducting atomic force microscopy |
| title_short |
Spatially resolved diagnosis of stress-induced breakdown in oxide dots by in situ conducting atomic force microscopy |
| title_full |
Spatially resolved diagnosis of stress-induced breakdown in oxide dots by in situ conducting atomic force microscopy |
| title_fullStr |
Spatially resolved diagnosis of stress-induced breakdown in oxide dots by in situ conducting atomic force microscopy |
| title_full_unstemmed |
Spatially resolved diagnosis of stress-induced breakdown in oxide dots by in situ conducting atomic force microscopy |
| title_sort |
spatially resolved diagnosis of stress-induced breakdown in oxide dots by in situ conducting atomic force microscopy |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/112651 |
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1781789110952787968 |