A new class of codes in lee metric and their application to error-correcting modulation codes

A new class of codes in lee metric and their application to error-correcting modulation codes

10.1109/20.539222

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Bibliographic Details
Main Authors: Krachkovsky, V.Y., Lee, Y.X.
Other Authors: DATA STORAGE INSTITUTE
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/112683
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Institution: National University of Singapore
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Summary:10.1109/20.539222

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