A new class of codes in lee metric and their application to error-correcting modulation codes
10.1109/20.539222
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Main Authors: | Krachkovsky, V.Y., Lee, Y.X. |
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Other Authors: | DATA STORAGE INSTITUTE |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/112683 |
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Institution: | National University of Singapore |
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