Thickness dependence of X-ray absorption and photoemission in Fe thin films on Si(0 0 1)

Thickness dependence of X-ray absorption and photoemission in Fe thin films on Si(0 0 1)

10.1016/j.elspec.2005.12.006

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Bibliographic Details
Main Authors: Gao, X., Qi, D., Tan, S.C., Wee, A.T.S., Yu, X., Moser, H.O.
Other Authors: PHYSICS
Format: Article
Published: 2014
Subjects:
Fe/Si(0 0 1)
Interface
Valence band photoemission
X-ray absorption spectroscopy
Online Access:http://scholarbank.nus.edu.sg/handle/10635/113044
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Institution: National University of Singapore
Description
Summary:10.1016/j.elspec.2005.12.006

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