Thickness dependence of X-ray absorption and photoemission in Fe thin films on Si(0 0 1)
10.1016/j.elspec.2005.12.006
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Main Authors: | , , , , , |
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Other Authors: | |
Format: | Article |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/113044 |
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Institution: | National University of Singapore |