Use of the track structure approach in TEM
10.1016/S0304-3991(00)00019-X
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sg-nus-scholar.10635-1130462023-10-27T07:33:51Z Use of the track structure approach in TEM Bourdillon, A.J. SINGAPORE SYNCHROTRON LIGHT SOURCE Electron energy-loss Impact parameter TEM 10.1016/S0304-3991(00)00019-X Ultramicroscopy 83 3-4 261-264 ULTRD 2014-11-28T08:43:39Z 2014-11-28T08:43:39Z 2000-06 Article Bourdillon, A.J. (2000-06). Use of the track structure approach in TEM. Ultramicroscopy 83 (3-4) : 261-264. ScholarBank@NUS Repository. https://doi.org/10.1016/S0304-3991(00)00019-X 03043991 http://scholarbank.nus.edu.sg/handle/10635/113046 000087227000010 Scopus |
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Electron energy-loss Impact parameter TEM |
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Electron energy-loss Impact parameter TEM Bourdillon, A.J. Use of the track structure approach in TEM |
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10.1016/S0304-3991(00)00019-X |
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SINGAPORE SYNCHROTRON LIGHT SOURCE |
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SINGAPORE SYNCHROTRON LIGHT SOURCE Bourdillon, A.J. |
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Bourdillon, A.J. |
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Bourdillon, A.J. |
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Use of the track structure approach in TEM |
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Use of the track structure approach in TEM |
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Use of the track structure approach in TEM |
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Use of the track structure approach in TEM |
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Use of the track structure approach in TEM |
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use of the track structure approach in tem |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/113046 |
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