Impact parameters and intraband scattering in electron diffraction from thin foils

by Bourdillon, A.J.
Published 2014

Use of the track structure approach in TEM

by Bourdillon, A.J.
Published 2014

Interband scattering of channelled electrons suffering high energy losses

by Bourdillon, A.J., Cha, C.L.
Published 2014

Displacement damage in supported YBa2Cu3O7-x thin films and finite-element simulations

by Bourdillon, A.J., Tan, N.X.
Published 2014

Hot isostatically pressed Bi2Sr2Ca2Cu3O10 coils made with novel precursors

by Bourdillon, A.J., Tan, N.X., Ong, C.L.
Published 2014

Analysis of coatings which inhibit epoxy bleeding in electronic packaging

by Tan, N.X., Lim, K.H.H., Bourdillon, A.J.
Published 2014

A critical condition in Fresnel diffraction used for ultra-high resolution lithographic printing

by Bourdillon, A.J., Boothroyd, C.B., Kong, J.R., Vladimirsky, Y.
Published 2014

Transmission electron microscopy observation of CMOS devices of titanium self-aligned silicide technology with nitrogen (N+) implantation process

by Jia, Y.M., Lim, C.W., Bourdillon, A.J., Boothroyd, C.
Published 2014

Elimination of 'bottom pinching' effect in environmentally stable chemically amplified resist

by Soo, C.P., Fan, M.H., Bourdillon, A.J., Chan, L.
Published 2014

Novel fiducial grid for X-ray masks

by Soo, C.P., Chandra, S., Kong, J.R., Bourdillon, A.J., Lu, B.
Published 2014

Study of acid diffusion in a positive tone chemically amplified resist using an on-wafer imaging technique

by Lu, B., Taylor, J.W., Cerrina, F., Soo, C.P., Bourdillon, A.J.
Published 2014

Orientation anomalies in plating thickness measurements from advanced packaging substrates

by Tan, N.X., Lee, A.J.Y., Bourdillon, A.J., Tan, C.Y.S.
Published 2014

Thermal stability in high-Tc coil and magnet design by process control of Bi(Pb)-2223/Ag multifilamentary tapes

by Vo, N.V., Neo, C.C., Bourdillon, A.J., Dou, S.X., Liu, H.K.
Published 2014

Study on the effect of incorporating nitrogen ions on titanium disilicide thin film formation for ULSI applications

by Lim, C.W., Bourdillon, A.J., Gong, H., Lahiri, S.K., Pey, K.L., Lee, K.H.
Published 2014

Transmission electron microscopy of defects in NMOS and PMOS structures

by Bourdillon, A.J., Koh, Y.G., Chiang, S.L., Lim, C.W., Kong, J.R., Cao, G.
Published 2014

Enhancement or reduction of catalytic dissolution reaction in chemically amplified resists by substrate contaminants

by Soo, C.P., Valiyaveettil, S., Huan, A., Wee, A., Ang, T.C., Fan, M.H., Bourdillon, A.J., Chan, L.H.
Published 2014

Improvement on lithography pattern profile by plasma treatment

by Soo, C.P., Bourdillon, A.J., Valiyaveettil, S., Huan, A., Wee, A., Fan, M.H., Ang, T.C., Chan, L.H.
Published 2014

Surface smoothing of floating gates in flash memory devices via surface nitrogen and carbon incorporation

by Cha, C.-L., Chor, E.-F., Gong, H., Bourdillon, A.J., Jia, Y.-M., Pan, J.-S., Zhang, A.-Q., Chan, L.
Published 2014

Enhancement of hot-carrier injection resistance for deep submicron transistor gate dielectric with a powered solenoid

by Cha, C.-L., Tee, K.-C., Chor, E.-F., Gong, H., Prasad, K., Bourdillon, A.J., See, A., Chan, L., Lee, M.M.-O.
Published 2014

Evaluation of silicon nitride and silicon carbide as efficient polysilicon grain-growth inhibitors

by Cha, C.L., Chor, E.F., Jia, Y.M., Bourdillon, A.J., Gong, H., Pan, J.S., Zhang, A.Q., Tang, S.K., Boothroyd, C.B.
Published 2014