Enhancement of hot-carrier injection resistance for deep submicron transistor gate dielectric with a powered solenoid

Enhancement of hot-carrier injection resistance for deep submicron transistor gate dielectric with a powered solenoid

10.1063/1.125579

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Bibliographic Details
Main Authors: Cha, C.-L., Tee, K.-C., Chor, E.-F., Gong, H., Prasad, K., Bourdillon, A.J., See, A., Chan, L., Lee, M.M.-O.
Other Authors: MATERIALS SCIENCE
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/62141
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/62141

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