Enhancement of hot-carrier injection resistance for deep submicron transistor gate dielectric with a powered solenoid
10.1063/1.125579
Saved in:
Main Authors: | Cha, C.-L., Tee, K.-C., Chor, E.-F., Gong, H., Prasad, K., Bourdillon, A.J., See, A., Chan, L., Lee, M.M.-O. |
---|---|
Other Authors: | MATERIALS SCIENCE |
Format: | Article |
Published: |
2014
|
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/62141 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Similar Items
-
HOT-CARRIER CHARACTERIZATION OF TUNGSTEN POLYCIDE GATE AND GRADED-JUNCTION MOS TRANSISTORS
by: LOU CHOON LEONG
Published: (2020) -
Effect of substrate hot-carrier injection on quasibreakdown of ultrathin gate oxide
by: Cho, B.J., et al.
Published: (2014) -
Direct tunneling currents through gate dielectrics in deep submicron MOSFETs
by: Hou, Y., et al.
Published: (2014) -
Hot-carrier mechanisms in advanced NMOS transistors
by: PHUA WEE HONG, TIMOTHY
Published: (2010) -
Interface engineering for the enhancement of carrier transport in black phosphorus transistor with ultra-thin high-? gate dielectric
by: Ling, Z.-P, et al.
Published: (2020)