Effect of substrate hot-carrier injection on quasibreakdown of ultrathin gate oxide

Journal of Applied Physics

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Bibliographic Details
Main Authors: Cho, B.J., Xu, Z., Guan, H., Li, M.F.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/62095
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Institution: National University of Singapore